Published in
Elsevier, Mendeleev Communications, 4(14), p. 155-157
DOI: 10.1070/mc2004v014n04abeh001963
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The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy
Journal article published in 2004 by
Oksana V. Kotova,
Svetlana V. Eliseeva,
Elena V. Perevedentseva,
Tatyana F. Limonova,
Raida A. Baigeldieva,
Alexey G. Vitukhnovsky,
Natalia P. Kuzmina 
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Abstract
The layer-by-layer roughness of org. LED (OLED)-component functional thin films deposited from different solvents by a spin-coating method was studied using at. force microscopy (AFM) facilities. [on SciFinder(R)]