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Elsevier, Surface Science, 1-3(392), p. 52-61

DOI: 10.1016/s0039-6028(97)00492-5

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PbPC growth on Si surfaces studied with XPS and various SPM techniques

Journal article published in 1997 by L. Ottaviano, L. Lozzi ORCID, S. Santucci, S. Di Nardo, S. Di Nardo, M. Passacantando ORCID
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We have studied the growth mode of lead-phthalocyanine sublimated in ultrahigh vacuum conditions over Si(100)-(2 × 1) and Si(111)-(7 × 7) clean substrates. The samples have been studied in situ by means of X-ray photoelectron spectroscopy using non-monochromatized and monochromatized radiation, and also with a combined atomic force microscope (AFM)/scanning tunneling microscopy (STM) instrument. Occasionally their morphology has been also determined in air by means of a tapping-mode AFM. We give strong evidences for a planar adsorption of the shuttle-cock shaped PbPC molecule over the two substrates at the very initial stages of deposition. We report some original results of a combined STM/AFM experiment with measurements showing simultaneously taken height and tip-sample interaction force maps.