When the excitation energy is in the vicinity of the absorption-edge of an element, X-ray emission, following the absorption, is called resonant inelastic X-ray scattering (RIXS). RIXS is much more highly sensitive to chemical-states of the element than conventional fluorescent X-rays. Thus, RIXS can be a useful "fingerprint" in material characterization. In this article, the basic aspects of RIXS spectroscopy are surveyed while emphasizing the relationship to X-ray absorption fine structures and fluorescent X-ray spectra. Also, its applications to analytical chemistry are discussed along with several recent examples.