Published in

American Institute of Physics, Journal of Applied Physics, 5(112), p. 051901, 2012

DOI: 10.1063/1.4751458

American Institute of Physics, Journal of Applied Physics, 5(110), p. 051901

DOI: 10.1063/1.3625609

American Institute of Physics, Journal of Applied Physics, 6(116), p. 066701

DOI: 10.1063/1.4891444

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Preface to Special Topic: Piezoresponse force microscopy and nanoscale phenomena in polar materials

Journal article published in 2011 by Zuo-Guang Ye, Nagarajan Valanoor ORCID, Nazanin Bassiri-Gharb, Sergei V. Kalinin ORCID, Andrei L. Kholkin ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

The present special issue of the Journal of Applied Physics contained selected papers from the 13th and 14th International Conference on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, held in Nanjing, China and Prague, The Czech Republic in July 2013. This conference was jointly held with the 22nd IEEE International Symposium on Application of Ferroelectrics (ISAF). These meeting continued the series of Piezoresponse Force Microscopy Conferences and Workshops first started in 2007 in Oak Ridge, US. The workshops comprised of tutorials on fundamentals of PFM operation, relevant instrumental advancements, image and electromechanical response interpretation, along with experimental hands-on classes in the PFM laboratories equipped with modern PFM setups. The Prague and Nanjing workshops featured a set of invited and contributed talks on principles and applications of PFM, with the selected papers presented in this special issue.