American Institute of Physics, Applied Physics Letters, 14(86), p. 142903
DOI: 10.1063/1.1897044
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We report the effect of a definite miscut of yttria-stabilized zirconia (YSZ) (100) single-crystal substrates onto the number of azimuthal domain variants within epitaxial La-substituted Bi4Ti3O12 (BLT) ferroelectric thin films as well as within SrRuO3 electrode layers, both grown on these substrates. YSZ substrates with a miscut angle of 5° were studied, with two different directions of the miscut, viz., YSZ[001] and YSZ[011]. A reduction of the number of azimuthal domain variants by 50% was attained on substrates with a [011]-directed miscut. Due most probably to the reduced number of azimuthal domain boundaries, larger remanent polarization values were attained in BLT films when grown on miscut substrates.