The advantages of neutrons for probing bulk structures are well known: they provide statistically averaged correlation functions over a large range of length scales and they are sensitive to light atoms such as hydrogen. These same qualities are, in principle, useful in the study of surfaces and buried morphologies in thin films, especially when the films are polymeric or biological. However, because of the limited sample volume for such systems, the scattering is weak, especially if the neutron beam has to be severely collimated in order to resolve distances of interest (typically 10 to several 100 nm parallel to the surface of the sample). SERGIS is a technique that can potentially overcome these limitations by allowing high resolution measurements of lateral surface structure without requiring tight beam collimation. In this paper we discuss recent progress towards implementing SERGIS both at the Low Energy Neutron Source at Indiana University and on the Asterix reflectometer at the Los Alamos Neutron Science Center (LANSCE). The architecture we use exploits a robust symmetry-related cancellation of Larmor phase aberrations. The spatial resolution it achieves closely mimics that of the ideal magnetic Wollaston prisms. To make progress in understanding SERGIS, we have applied it to the measurement of simple diffraction gratings and developed a dynamical theory that accounts quantitatively and without adjustable parameters for all of the data sets we have measured to date. We argue here that, if SERGIS is to be applied to the study of weakly scattering thin films, it will be necessary to develop the technique of dark-field spin echo scattering angle measurement.