Interpretation of the two-components observed in high resolution X-ray diffraction omega-scan peaks from mosaic thin films: case of both PLD-grown ZnO on c-sapphire substrate and MBE-grown GaP on silicon substrate
Proceedings article published in 2011 by
Olivier Durand,
Antoine Létoublon,
D. J. Rogers,
F. Hosseini Teherani,
Charles Cornet 
,
Alain Le Corre,
Alain Le Corre
,
Alain Le Corre,
Alain Le Corre
