Published in

American Scientific Publishers, Journal of Nanoscience and Nanotechnology, 3(13), p. 1798-1801

DOI: 10.1166/jnn.2013.6992

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Time-Resolved Ultraviolet Near-Field Scanning Optical Microscope for Characterizing Photoluminescence Lifetime of Light-Emitting Devices

This paper is available in a repository.
This paper is available in a repository.

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Abstract

We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.