Epitaxial equiatomic Fe50Pt50 thin films with a variable order parameter ranging from 0 to 0.9 and Fe100-xPtx thin films with x ranging from 33 to 50 were deposited on MgO (001) substrates by dc sputtering. A seed layer consisting of nonmagnetic Cr (4 nm)/Pt(12 nm) was used to promote the crystallinity of the magnetic films. The crystal structure and magnetic properties were gauged using x-ray diffraction and magnetometry. The magnetic anisotropy can be controlled by changing the order parameter. For Fe100-xPtx films, the increase in Fe composition leads to an increase in coercivity in the hard axis loop and causes a loss of perpendicular anisotropy.