Despite their large interest, the behaviour of U-based multilayers has been so far almost unexplored. In this work we report the preparation of U/Co multilayers by dc-sputtering, using two different currents (samples A and B), and its characterization by grazing-incidence X-ray diffraction, Rutherford backscattering spectrometry, electrical resistivity, ac-susceptibility and magnetization measurements, The layers are mainly amorphous, with small amounts of partially disordered U-Co binary phases, and with a roughness or mixing depth of a few tens of A. RBS measurements indicate that the A samples have lower mixing than B. However, resistivity measurements point to a similar degree of disorder in all the samples. The multilayers have a ferromagnetic behaviour, with a saturation magnetization increasing with the thickness of the layers.