American Institute of Physics, Review of Scientific Instruments, 11(73), p. 3778-3783, 2002
DOI: 10.1063/1.1510552
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To measure spin-polarized core-level electron spectra, a spectrometer equipped with a highly efficient retarding-potential Mott spin polarimeter using undulator-based soft-x-ray beamlines has been set up. With a thin film of Au as a target this polarimeter has an efficiency estimated to be ∼ 2×10−4. The performance of this system for spin-polarized spectroscopy has been tested using core-level spin-polarized photoemission of magnetic and nonmagnetic thin films excited with linearly and circularly polarized light, respectively. Measurements using a new spin-resolved absorption technique are also discussed. © 2002 American Institute of Physics.