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American Institute of Physics, AIP Conference Proceedings, 2013

DOI: 10.1063/1.4791207

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Preparation And Characterization Of Fe-Si-B Thin Films

Proceedings article published in 2013 by M. Satalkar, S. N. Kane ORCID, A. Pasko, A. Apolinário ORCID, C. T. Sousa ORCID, J. Ventura, J. J. Belo, J. M. Teixeira, J. P. Araujo, F. Mazaleyrat, E. Fleury
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Abstract

Thickness dependence of structural and magnetic properties of Fe 79 Si 8 B 13 films has been studied using magnetic measurements, X-ray diffraction (XRD) and scanning electron microscopy (SEM). Prepared films exhibit the presence of nanocrystalline α-Fe phase embedded in amorphous matrix. Magnetic measurements show their homogeneous nature (within film plane). Direction perpendicular to film plane is the hard direction of magnetization. A cross-sectional SEM measurement provides film thickness. SEM also reveals the granular structure of the films.