Published in
2015 IEEE 12th International Symposium on Biomedical Imaging (ISBI)
DOI: 10.1109/isbi.2015.7163922
Links
- Institute of Electrical and Electronics Engineers
- [arxiv.org] | PDF
- [www.researchgate.net]
- [arxiv.org] | PDF
- [arxiv.org] | PDF
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Post-acquisition image based compensation for thickness variation in microscopy section series
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