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Published in

American Institute of Physics, Applied Physics Letters, 19(91), p. 193512

DOI: 10.1063/1.2812571

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Soldering to a single atomic layer

Journal article published in 2007 by Çağlar Ö. Girit, Çağlar Ö. Girit, A. Zettl ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The standard technique to make electrical contact to nanostructures is electron beam lithography. This method has several drawbacks including complexity, cost, and sample contamination. We present a simple technique to cleanly solder submicron sized, Ohmic contacts to nanostructures. To demonstrate, we contact graphene, a single atomic layer of carbon, and investigate low- and high-bias electronic transport. We set lower bounds on the current carrying capacity of graphene. A simple model allows us to obtain device characteristics such as mobility, minimum conductance, and contact resistance.