Published in

American Institute of Physics, Applied Physics Letters, 14(103), p. 142113

DOI: 10.1063/1.4824335

Links

Tools

Export citation

Search in Google Scholar

Evaluation of potential variations around grain boundaries in BaSi2 epitaxial films by Kelvin probe force microscopy

Journal article published in 2013 by Masakazu Baba, Sadahiro Tsurekawa, Kentaro Watanabe ORCID, W. Du, Kaoru Toko, Kosuke O. Hara ORCID, Noritaka Usami, Takashi Sekiguchi, Takashi Suemasu
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Orange circle
Published version: archiving restricted
Upload
Policy details
Data provided by SHERPA/RoMEO