Soft X-ray resonant magnetic scattering (SXRMS) has been used to investigate the microscopic magnetization reversal behavior of complex magnetic systems. SXRMS is a unique technique, providing chemical, spatial and magnetic sensitivity, which is not affected by external magnetic fields. The study of two selected thin magnetic heterostructures is presented, amorphous rare-earth transition metal alloys and perpendicular exchange coupled antiferromagnetic/ferromagnetic films. In the first system, the internal structure of magnetic stripe domains on nanometer length scales is obtained by measuring bi-dimensional (2D) scattering images. In the second system, the element specificity is exploited to identify the role of the uncompensated spins in the antiferromagnetic layer on the exchange coupling phenomena. Future trends are also discussed.