Published in
EDP Sciences, The European Physical Journal B, 1(28), p. 45-48
DOI: 10.1140/epjb/e2002-00197-6
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Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method
Journal article published in 2002 by
Jun Cai,
Jian-Sheng Wang 
This paper is made freely available by the publisher.
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