Chandra Source Catalog processing recalibrates each observation using the latest available calibration data, and employs a wavelet-based source detection algorithm to identify all the X-ray sources in the field of view. Source properties are then extracted from each detected source that is a candidate for inclusion in the catalog. Catalog processing is completed by matching sources across multiple observations, merging common detections, and applying quality assurance checks. The Chandra Source Catalog processing system shares a common processing infrastructure and utilizes much of the functionality that is built into the Standard Data Processing (SDP) pipeline system that provides calibrated Chandra data to end-users. Other key components of the catalog processing system have been assembled from the portable CIAO data analysis package. Minimal new software tool development has been required to support the science algorithms needed for catalog production. Since processing pipelines must be instantiated for each detected source, the number of pipelines that are run during catalog construction is a factor of order 100 times larger than for SDP. The increased computational load, and inherent parallel nature of the processing, is handled by distributing the workload across a multi-node Beowulf cluster. Modifications to the SDP automated processing application to support catalog processing, and extensions to Chandra Data Archive software to ingest and retrieve catalog products, complete the upgrades to the infrastructure to support catalog processing.