Published in
Elsevier, Ultramicroscopy, 2(110), p. 176
DOI: 10.1016/j.ultramic.2009.11.012
Links
Tools
Erratum to “advanced thin film technology for ultrahigh resolution X-ray microscopy” [Ultramicroscopy 109 (2009) 1360–1364]
Journal article published in 2010 by
Joan Vila-Comamala 
,
Konstantins Jefimovs,
Jörg Raabe,
Tero Pilvi,
Rainer H. Fink,
Mathias Senoner,
Andre Maaßdorf,
Mikko Ritala,
Christian David
,
Konstantins Jefimovs,
Jörg Raabe,
Tero Pilvi,
Rainer H. Fink,
Mathias Senoner,
Andre Maaßdorf,
Mikko Ritala,
Christian David
This paper is available in a repository.
Full text: Download
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 