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Optica, Optics Letters, 11(27), p. 888, 2002

DOI: 10.1364/ol.27.000888

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Phase determination in interference-based superresolving microscopes through critical frequency analysis

Journal article published in 2002 by Stefan W. Hell, Carlo Mar Blanca, Jörg Bewersdorf
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Data provided by SHERPA/RoMEO

Abstract

Utilizing the interference of wave fronts of two opposing lenses, 4Pi-confocal and I(5)M microscopy improve the axial resolution of far-field fluorescence microscopy as much as threefold to sevenfold. However, establishing the phase difference of the wave fronts in the sample is a problem yet to be solved. Here we show that the phase difference is encoded in the microscope's transfer of the spatial frequencies that match the distance of the interference peaks. As a result the phase difference is readily extracted through a Fourier transform of the image. Our method is relevant to all microscopes that exploit the interference of counterpropagating waves to improve the axial and the lateral resolution.