Trans Tech Publications, Journal of Metastable and Nanocrystalline Materials, (20-21), p. 195-200, 2004
DOI: 10.4028/www.scientific.net/jmnm.20-21.195
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Diamond replicas, concerning to the fidelity, were quantitatively evaluated in this work. We analyzed the dimensions and morphology of the silicon molds and diamond replicas by atomic force microscopy. The micrometric and nanometric characterization were performed for different substrate pretreatments.