We report on the surface antiferromagnetic (AFM) domain imaging of the prototype antiferromagnet NiO(100) using an electron-microscopy-based laboratory method. Coherently exchange-scattered electrons from the surface AFM lattice are utilized in a low-energy electron microscope to resolve the surface domain structure. Direct comparison with x-ray magnetic linear dichroism photoemission electron microscopy demonstrates a complimentary nature. High surface sensitivity combined with improved spatial resolution of this method enables studying of nanosized magnetic domains in NiO(100) thin films and their thickness-dependent evolution.