Published in

Trans Tech Publications, Journal of Metastable and Nanocrystalline Materials, (20-21), p. 775-780, 2004

DOI: 10.4028/www.scientific.net/jmnm.20-21.775

Links

Tools

Export citation

Search in Google Scholar

Measurement of Electrical Resistivity of Nanostructured Platinum Thin Films and Quantum Mechanical Estimates

Journal article published in 2004 by M. C. Salvadori ORCID, A. R. Vaz, R. J. C. Farias, M. Cattani
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Red circle
Preprint: archiving forbidden
Red circle
Postprint: archiving forbidden
Green circle
Published version: archiving allowed
Upload
Policy details
Data provided by SHERPA/RoMEO

Abstract

Nanostructured platinum thin films, with thickness going from 1.31 up to 11.66 nm, have been deposited by vacuum arc plasma. We have measured their electrical resistivity and surface roughness. The resistivity results are compared with theoretical predictions obtained using a quantum mechanical approach.