Published in

Elsevier, Materials Letters, (94), p. 201-205

DOI: 10.1016/j.matlet.2012.12.060

Links

Tools

Export citation

Search in Google Scholar

Evidence of crystallographic orientation dependence upon cyclic microindentation-induced recrystallization within amorphous surface layer

Journal article published in 2013 by R. G. Jasinevicius, J. G. Duduch, P. S. Pizani ORCID
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Red circle
Postprint: archiving forbidden
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Cyclic microindentation experiments were performed using Vickers indenter to investigate whether microindentation induce phase transformations within amorphous silicon layer formed onto the machined surface after single point diamond turning. Although the microindentation induced phase transformation shows direct relationship with crystallographic direction during cyclic microindentation of silicon single crystal, the similar behavior was never probed into machined induced amorphization samples. Phase transformation was probed by micro Raman spectroscopy, which revealed direct evidence not only of recrystallization but also the multiple phase generation. The results indicated that the direction [1 0 0] presented as more susceptible to undergo phase transformation and achieve multiple phases with less microindentation cycles than the [1 1 0] one.