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Taylor and Francis Group, Philosophical Magazine, 10(90), p. 1359-1372

DOI: 10.1080/14786430903352656

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Microstructural evolution of [PbZrxTi1–xO3/PbZryTi1–yO3]nepitaxial multilayers (x/y= 0.2/0.4, 0.4/0.6)–dependence on layer thickness

Journal article published in 2010 by Y. L. Zhu, S. J. Zheng, X. L. Ma, L. Feigl, M. Alexe ORCID, D. Hesse, I. Vrejoiu
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The microstructure of ferroelectric [PbZr x Ti1− x O3/PbZr y Ti1− y O3] n epitaxial multilayers (x/y = 0.2/0.4, 0.4/0.6) deposited on SrRuO3-coated SrTiO3 substrates by pulsed-laser deposition with different layer periodicity and layer thickness was characterized by means of transmission electron microscopy. Electron diffraction and contrast analysis revealed a very clear and well-separated layer sequence. The microstructures of PbZr0.2Ti0.8O3/PbZr0.4Ti0.6O3 and PbZr0.4Ti0.6O3/PbZr0.6Ti0.4O3 multilayers show a similar tendency in the dependence on the individual layer thickness. Whereas with thick individual layers, tetragonal a-domains are confined to specific layers of the two types of multilayers, below a certain critical thickness of the individual layers, a-domains extend over the whole film. This indicates a transition into a uniform tetragonal lattice and strain state of the whole multilayer. Increasing the layer periodicity further, the interfaces in PbZr0.4Ti0.6O3/PbZr0.6Ti0.4O3 multilayers become rough, and complex a-domain configurations appear.