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2005 International Conference On Simulation of Semiconductor Processes and Devices

DOI: 10.1109/sispad.2005.201482

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ESD Protection Design Optimization Using a Mixed-Mode Simulation and Its Impact on ESD Protection Design of Power Bus Line Resistance

Proceedings article published in 2005 by H. Hayashi, T. Kuroda, K. Kato, K. Fukuda ORCID, S. Baba, Y. Fukuda
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

This paper presents a new optimization method of ESD protection design using a mixed-mode ESD simulation with a calibrated model based on DC and TLP characteristics. As a result, the influence of power bus line resistance on ESD protection design is clarified using the calibrated model for each device used in ESD protection circuit. ESD surge flows into an internal circuit easily as the value of the power bus line resistance increases even if the ESD tolerance of a power clamp element is high enough.