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Elsevier, Ultramicroscopy, (116), p. 77-85

DOI: 10.1016/j.ultramic.2012.03.011

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Direct structure inversion from exit waves. Part II: A practical example

Journal article published in 2012 by A. Wang, F. R. Chen, S. Van Aert ORCID, D. Van Dyck
This paper is available in a repository.
This paper is available in a repository.

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Abstract

This paper is the second part of a two-part paper on direct structure inversion from exit waves. In the first part, a method has been proposed to quantitatively determine structure parameters with atomic resolution such as atom column positions, surface profile and the number of atoms in the atom columns. In this part, the theory will be demonstrated by means of a Au[110] exit wave reconstructed from a set of focal-series images. The procedures to analyze the experimentally reconstructed exit wave in terms of quantitative structure information are described in detail.