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Springer Verlag, JETP Letters, 12(99), p. 706-711

DOI: 10.1134/s002136401412011x

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Analysis of the structure and magnetic properties of an interface in multilayered (Fe/Si) N nanostructures with the surface-sensitive XMCD method

Journal article published in 2014 by M. S. Platunov ORCID, S. N. Varnakov, S. M. Zharkov, G. V. Bondarenko, E. Weschke, E. Schierle, S. G. Ovchinnikov
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The structural and magnetic properties of (Fe/Si)N nanostructures obtained by successive deposition on the SiO2/Si(100) surface at a temperature of the substrate of 300 K have been studied. The thicknesses of all Fe and Si layers have been determined by transmission electron microscopy measurements. The magnetic properties have been studied by the X-ray magnetic circular dichroism (XMCD) method near the Fe L 3, 2 absorption edges. The orbital (ml) and spin (mS) contributions to the total magnetic moment of iron have been separated. The thicknesses of magnetic and nonmagnetic iron silicide on the Si/Fe and Fe/Si interfaces have been determined with the surface sensitivity of the XMCD method and the model of the interface between the nonmagnetic and weakened magnetic phases.