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American Institute of Physics, Applied Physics Letters, 24(106), p. 241604

DOI: 10.1063/1.4922801

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Experimental verification of total absorption by a low-loss thin dielectric layer

Journal article published in 2015 by Ana Diaz-Rubio ORCID, Alastair P. Hibbins, Jorge Carbonell ORCID, José Sánchez-Dehesa ORCID
This paper is available in a repository.
This paper is available in a repository.

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