Nature of Electron Scattering in LaAlO<sub>3</sub>/SrTiO<sub>3</sub> Interfaces Near the Critical Thickness
Journal article published in 2014 by
C. J. Li,
W. M. Lü,
X. Renshaw Wang,
X. P. Qiu,
L. Sun,
S. W. Zeng,
Z. Q. Liu,
Z. Huang 
,
Y. L. Zhao,
Ariando,
T. Venkatesan
,
Y. L. Zhao,
Ariando,
T. Venkatesan
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Abstract
Abrupt metal-to-insulator transition at the polar (e.g., LaAlO3) and nonpolar oxide (e.g., SrTiO3) heterointerfaces is fascinating. In the vicinity of the metal-to-insulator transition critical thickness where the exact critical thickness is found to be 3.65 ± 0.05 uc, strain, carrier concentration, and Kondo induced scattering manifest their great sensitive role on carrier mobility in LaAlO3/SrTiO3 interfaces.