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2014 IEEE 9th IberoAmerican Congress on Sensors

DOI: 10.1109/ibersensor.2014.6995513

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Gold Ball Bumping versus E-less Ni/Au remetallization for chemical sensor integration using lead-free soldering for flip chip assembly

This paper is available in a repository.
This paper is available in a repository.

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Abstract

The use of analytical systems capable of performing analysis of high amount of chemical parameters is growing up. These microsystems known as µ-TAS (Micro Total Analysis Systems) can replace many steps carried out in laboratories allowing a more accurate and autonomous process. The sensors based in the microelectronic technology has a lot to offer to µTAS due to its small size and mass production. To reach a high level of miniaturization these devices are integrated in its bare die shape. However, the bonding pads finish in these devices is made of aluminum, which do not allow a direct soldering process using solder pastes for a flip chip assembly method. This work addresses this issue, evaluating the solderability using lead-free solder pastes for two solder bump processes: the SBB (Stud Ball Bumping) and Electroless Ni/Au UBM (Under Bump Metallurgy) in order to allow the interconnection between different sensors and substrates. Keywords— SBB, E-less Ni/Au, flip chip, lead-free solder paste.