Published in
IOP Publishing, Nanotechnology, 18(24), p. 185704
DOI: 10.1088/0957-4484/24/18/185704
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Probing local strain and composition in Ge nanowires by means of tip-enhanced Raman scattering
Journal article published in 2013 by
J. S. Reparaz,
N. Peica,
R. Kirste,
A. R. Goñi 
,
A. R. Gõ Ni,
M. R. Wagner,
G. Callsen,
M. I. Alonso ,
M. Garriga,
I. C. Marcus,
A. Ronda,
I. Berbezier,
J. Maultzsch,
C. Thomsen,
A. Hoffmann
,
A. R. Gõ Ni,
M. R. Wagner,
G. Callsen,
M. I. Alonso ,
M. Garriga,
I. C. Marcus,
A. Ronda,
I. Berbezier,
J. Maultzsch,
C. Thomsen,
A. Hoffmann
This paper is available in a repository.
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