Elsevier, Physica B: Condensed Matter, 1-2(397), p. 43-46
DOI: 10.1016/j.physb.2007.02.090
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While structural and magnetic lateral correlations in thin film materials can be investigated at the μm length scale by neutron off-specular scattering (OSS) with polarization analysis, they can also be investigated at the nm length scale by grazing incidence small-angle scattering of polarized neutrons (polarized GISANS). We exemplify this issue showing a combined OSS and GISANS study of the lateral correlations in a remanent polarizing supermirror.