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Published in

Elsevier, Optical Materials, (48), p. 71-74, 2015

DOI: 10.1016/j.optmat.2015.07.028

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Direct measurement of photo-induced nanoscale surface displacement in solids using atomic force microscopy

This paper is available in a repository.
This paper is available in a repository.

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Data provided by SHERPA/RoMEO

Abstract

The interaction between light and solid matter causes localized heating and surface displacement in the nanometer scale. The deformed surface can be analyzed by probing the time-dependent intensity of a laser reflected off of the surface using the thermal mirror (TM) method. This method provides quantitative measurements of thermal, optical and mechanical properties of a variety of materials. Here, we propose an alternative method to measure laser-induced surface deformation using atomic force microscopy (AFM). AFM is employed to determine the time evolution of the surface deformation and a theoretical model is proposed to determine physical properties of semi-transparent materials. The results are found to be in excellent agreement compared to those obtained using TM.