A study was conducted to determine the nature and magnitude of gene action and genetics of bacterial leaf blight resistance associated with yield and yield traits. Six generations viz., P1, P2, F1, F2, B1 and B2 of a cross between bacterial leaf blight susceptible high yielding rice variety HUR 105 and resistant NIL, IRBB 55, carrying two resistance genes xa13 and Xa21 were used in present study. The epistatic interaction model was found adequate to explain the gene action in days to maturity, panicle weight, fertile spikelet per panicle, total number of grains per panicle, test weight, disease severity. Additive and dominant gene effects were found important for all the traits examined. Additive gene effect contributed more to the resistance, while dominance and epitasis gene effect were found significant in most of the traits. The interaction was complementary for flag leaf length, spikelet fertility percentage and grain yield per plant, and duplicate epistasis was observed for the remaining traits. Bacterial leaf blight resistance, segregating populations were classified into three groups, moderately susceptible, moderately resistant and resistant under epiphytotic conditions. Gene pyramided lines were highly resistant to bacterial leaf blight than individuals with single gene indicating the non-allelic genes have duplicate effect when present together.