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Published in

IOP Publishing, Measurement Science and Technology, 10(23), p. 105901

DOI: 10.1088/0957-0233/23/10/105901

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A desktop supersonic free-jet beam source for a scanning helium microscope (SHeM)

Journal article published in 2012 by M. Barr, K. M. O'Donnell, A. Fahy ORCID, W. Allison, P. C. Dastoor
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

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Preprint: archiving forbidden
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Postprint: archiving forbidden
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Data provided by SHERPA/RoMEO

Abstract

A simple design for an inexpensive, compact, desktop-sized helium free-jet beam source is described. The apparatus, which is Campargue-like in design and utilizes mostly off-the-shelf parts, is capable of producing a centreline intensity of 1.2 × 10 19 atoms per second per steradian. The beam performance was investigated using a conventional ion gauge and a stagnation detector, with the latter being used to produce beam flux profiles. The profile of the macroskimmed beam has been experimentally demonstrated to be strongly Gaussian.