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American Institute of Physics, Applied Physics Letters, 7(106), p. 073301, 2015

DOI: 10.1063/1.4909530

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The role of the hole-extraction layer in determining the operational stability of a polycarbazole:fullerene bulk-heterojunction photovoltaic device

Journal article published in 2015 by E. Bovill, N. Scarratt, J. Griffin, H. Yi, A. Iraqi ORCID, A. R. Buckley, J. W. Kingsley, D. G. Lidzey ORCID
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We have made a comparative study of the relative operational stability of bulk-heterojunction organic photovoltaic (OPV) devices utilising different hole transport layers (HTLs). OPV devices were fabricated based on a blend of the polymer PCDTBT with the fullerene PC70BM, and incorporated the different HTL materials PEDOT:PSS, MoOx and V2O5. Following 620 h of irradiation by light from a solar simulator, we find that devices using the PEDOT:PSS HTL retained the highest efficiency, having a projected T80 lifetime of 14 500 h.