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IOP Publishing, New Journal of Physics, 3(12), p. 035006, 2010

DOI: 10.1088/1367-2630/12/3/035006

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Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study

Journal article published in 2010 by Ana Diaz ORCID, Virginie Chamard, Cristian Mocuta, Rogerio Magalhães-Paniago, Julian Stangl, Dina Carbone, Till H. Metzger, Günther Bauer
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

We investigate the feasibility of applying coherent diffraction imaging to highly strained epitaxial nanocrystals using finite-element simulations of SiGe islands as input in standard phase retrieval algorithms. We discuss the specific problems arising from both epitaxial and highly strained systems and we propose different methods to overcome these difficulties. Finally, we describe a coherent microdiffraction experimental setup using extremely focused x-ray beams to perform experiments on individual nanostructures.