We present a simplified design for a scanning helium microscope (SHeM) which utilises almost entirely off the shelf components. The SHeM produces images by detecting scattered neutral helium atoms from a surface, forming an entirely surface sensitive and non-destructive imaging technique. This particular prototype instrument avoids the complexities of existing neutral atom optics by replacing them with an aperture in the form of an ion beam milled pinhole, resulting in a resolution of around 5 microns. Using the images so far produced, an initial investigation of topological contrast has been performed.