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Elsevier, Thin Solid Films, 20(516), p. 6786-6790

DOI: 10.1016/j.tsf.2007.12.021

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New method for interface characterization in heterojunction solar cells based on diffusion capacitance measurements

Journal article published in 2008 by A. S. Gudovskikh, Rémy Chouffot, Jean-Paul Kleider, N. A. Kaluzhniy, V. M. Lantratov, S. A. Mintairov ORCID, J. Damon-Lacoste, D. Eon, Pere Roca I. Cabarrocas, P.-J. Ribeyron
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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