Taylor and Francis Group, Ferroelectrics, 1(390), p. 3-9
DOI: 10.1080/00150190902993309
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Fe in—diffusion was performed by depositing a Fe film on X-cut LN substrates by sputtering and subsequent annealing in a controlled atmosphere. The photorefractive properties of the Fe:LN film were studied by confocal Micro–Raman spectroscopy. The presence of unexpected lines in the Raman spectra of the samples was detected and attributed to the activation by the photoinduced space charge field which is also the cause of the photorefractive effect. The results in Fe-doped samples are compared to those recorded in nominally pure congruent crystals.