Oldenbourg Verlag, Zeitschrift für Kristallographie, 12(225), p. 616-624, 2010
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The main aberrations affecting data collected with 1D position sensitive detectors in Debye-Scherrer ca-pillary geometry are examined, and analytical corrections proposed. The equations are implemented in two of the most advanced software based on the Rietveld and Whole Powder Pattern Modelling methods, respectively, for struc-ture and microstructure analysis. Application to MYTHEN, a fast single photon counting detector developed at the Swiss Light Source, is discussed in detail.