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IOP Publishing, Nanotechnology, 38(20), p. 385707, 2009

DOI: 10.1088/0957-4484/20/38/385707

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Thickness-dependent bending modulus of hexagonal boron nitride nanosheets

Journal article published in 2009 by Chun Li, Yoshio Bando ORCID, Chunyi Zhi ORCID, Yang Huang, Chunyi Golberg, Dmitri Golberg
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Bending modulus of exfoliation-made single-crystalline hexagonal boron nitride nanosheets (BNNSs) with thicknesses of 25–300 nm and sizes of 1.2–3.0 µm were measured using three-point bending tests in an atomic force microscope. BNNSs suspended on an SiO2 trench were clamped by a metal film via microfabrication based on electron beam lithography. Calculated by the plate theory of a doubly clamped plate under a concentrated load, the bending modulus of BNNSs was found to increase with the decrease of sheet thickness and approach the theoretical C 33 value of a hexagonal BN single crystal in thinner sheets (thickness<50 nm). The thickness-dependent bending modulus was suggested to be due to the layer distribution of stacking faults which were also thought to be responsible for the layer-by-layer BNNS exfoliation.