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Instytut Podstaw Informatyki, Acta Physica Polonica A, 6(107), p. 977-982, 2005

DOI: 10.12693/aphyspola.107.977

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Structural studies of Titanium oxide multilayers

Journal article published in 2005 by Gp P. Karwasz, A. Miotello ORCID, E. Zomer, Rs S. Brusa, B. Koscielska ORCID, C. Armellini, A. Kuzmin ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.