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American Physical Society, Physical Review Letters, 20(72), p. 3133-3136, 1994

DOI: 10.1103/physrevlett.72.3133

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Measurement of the Silicon (220) Lattice Spacing

Journal article published in 1994 by G. Basile, A. Bergamin, G. Cavagnero, G. Mana ORCID, E. Vittone, G. Zosi
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferometry to about 3 x 10(-8) relative accuracy. The value obtained is d220 = 192015.551 +/- 0.005 fm. After correcting for the impurity-induced lattice contraction, d220 = 192 015.569 +/- 0.006 fm is obtained.