Recent developments in synchrotron storage ring technology, insertion device design and X-ray optics provide polarized photon beams with unprecedented intensity and brilliance on a microscopic area. Various arrangements allow micrometer size hard X-ray beams with enough flux to undertake elemental mapping of trace elements then easily associated with micro-diffraction or micro-extended X-ray absorption fine structure studies on the very same sample region of interest. These analytical possibilities and the sensitivity and accuracy of the achieved analysis can complement or surpass other available instrumental micro-analytical methods. Such microprobes are becoming a very interesting tool for material characterization.