Published in

Elsevier, Journal of Structural Biology, 2(171), p. 197-206, 2010

DOI: 10.1016/j.jsb.2010.03.011

Links

Tools

Export citation

Search in Google Scholar

A clustering approach to multireference alignment of single-particle projections in electron microscopy

Journal article published in 2010 by C. O. S. Sorzano ORCID, J. R. Bilbao-Castro, Y. Shkolnisky, M. Alcorlo, R. Melero ORCID, G. Caffarena-Fernández, M. Li, G. Xu, R. Marabini ORCID, J. M. Carazo ORCID
This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
Upload
Orange circle
Postprint: archiving restricted
Upload
Red circle
Published version: archiving forbidden
Policy details
Data provided by SHERPA/RoMEO

Abstract

Two-dimensional analysis of projections of single particles acquired by an electron microscope is a useful tool to help identifying the different kinds of projections present in a dataset and their different projection directions. Such analysis is also useful to distinguish between different kinds of particles or different particle conformations. In this paper we introduce a new algorithm for performing two-dimensional multireference alignment and classification that is based on a Hierarchical clustering approach using correntropy (instead of the more traditional correlation) and a modified criterion for the definition of the clusters specially suited for cases in which the Signal-to-Noise Ratio of the differences between classes is low. We show that our algorithm offers an improved sensitivity over current methods in use for distinguishing between different projection orientations and different particle conformations. This algorithm is publicly available through the software package Xmipp.