American Institute of Physics, Applied Physics Letters, 4(91), p. 044102
DOI: 10.1063/1.2759979
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X-ray diffraction is an important tool for studying multiphase materials because it can resolve parameters from each phase independently. When coupled with a high-flux, microfocussed x-ray beam, scanning microdiffraction experiments are possible. This letter reports on the use of this technique to image a fiber reinforced composite with a complex woven lamina geometry. These systems are difficult to study with other experimental techniques because the fibers are inaccessible and the matrix is often opaque. However, microfocused x-ray diffraction reveals how macroscopic load affects the weave microgeometry by reorienting the embedded fibers. (C) 2007 American Institute of Physics. ; ISI Document Delivery No.: 194LI Times Cited: 2 Cited Reference Count: 16 Davies, Richard J. Riekel, Christian Bennett, James A. Eichhorn, Stephen J. Young, Robert J.