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Trans Tech Publications, Materials Science Forum, (524-525), p. 291-296

DOI: 10.4028/www.scientific.net/msf.524-525.291

Trans Tech Publications, Materials Science Forum, p. 291-296

DOI: 10.4028/0-87849-414-6.291

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Residual stress analysis around foreign object damage using synchrotron diffraction

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Data provided by SHERPA/RoMEO

Abstract

The current study compares the residual strain around foreign object damage (FOD), measured using synchrotron diffraction, to the strain predicted by a plastic model with power-law dependence. It is shown that the measured strains are significantly lower than those predicted by the model. This may be explained in part, by the inability of the model to account for damage mechanisms such as micro-cracking and shear band formation. ; Frankel, P. Ding, J. Preuss, M. Byrne, J. Withers, P. J.