Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Dependable and Secure Computing, 3(21), p. 1331-1341, 2024
DOI: 10.1109/tdsc.2023.3278857
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Ablation Analysis for Multi-Device Deep Learning-Based Physical Side-Channel Analysis
Journal article published in 2024 by
Lichao Wu 
,
Yoo-Seung Won ,
Dirmanto Jap ,
Guilherme Perin ,
Shivam Bhasin ,
Stjepan Picek
,
Yoo-Seung Won ,
Dirmanto Jap ,
Guilherme Perin ,
Shivam Bhasin ,
Stjepan Picek
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